Graticules Optics FIB Lift Out Grids Lamella Carriers
FIB lift-out grids are specialized TEM grids designed for the precise and site-specific preparation of electron-transparent lamellas. Their multi-post design allows you to securely attach samples lifted from bulk material using a focused ion beam. These grids are essential for high-resolution analysis of specific areas of interest.
Product Information
FIB lift-out grids are a critical component for the modern, site-specific preparation of samples for Transmission Electron Microscopy (TEM) and other advanced analytical techniques. They are specifically engineered for use with the focused ion beam (FIB) lift-out method, which enables researchers to extract a microscopic slice (lamella) from a predetermined area of interest within a larger sample.
These specialized grids feature multiple posts or "fingers" to which the fragile lamellas are attached, providing superior stability compared to conventional TEM grids. Lift-out grids are available in various materials, including copper and molybdenum. The robust, yet accessible, design of the lift-out grids streamlines the workflow, minimizes sample damage, and ultimately helps you achieve high-quality, high-resolution results from even the most challenging materials.